N+ ion-irradiated Zr/SiO2 interface. XPS study.
نویسندگان
چکیده
منابع مشابه
XPS analysis of the dentin irradiated by Er: YAG laser.
The aim of this study was to investigate the effect of Er:YAG laser irradiation on human dentin surface using X-ray photoelectron spectroscopy (XPS). 10 human dentin disks were prepared from extracted human molars for XPS analysis. These specimens were divided into two groups of five: a control group and group that were irradiated by an Er:YAG laser beam (100 mJ, 1Hz). All specimens were analyz...
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Sintered samples of monoclinic zirconia (α-ZrO2) have been irradiated at room temperature with 6.0-GeV Pb ions in the electronic slowing down regime. X-ray diffraction (XRD) and micro-Raman spectroscopy measurements showed unambiguously that a transition to the ‘metastable’ tetragonal phase (β-ZrO2) occurred at a fluence of 6.5x10 cm for a large electronic stopping power value (≈ 32.5 MeV μm). ...
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In order to investigate the nature of defects produced by ion irradiation through a heterostructure, a silicon-on-insulator substrate with a buried SiO2 layer at a depth of ;1.5 mm was irradiated. The implantation was done using 2 MeV Si ions in the dose range of 0.2– 1310 cm. The subsequent defect analysis was performed using the Au labeling technique. Besides the presence of an expected exces...
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ژورنال
عنوان ژورنال: Journal of the Japan Society of Powder and Powder Metallurgy
سال: 1988
ISSN: 0532-8799,1880-9014
DOI: 10.2497/jjspm.35.177